TY  - JOUR
AU  - Zimmerman, Neil
AU  - Cobb, J.
AU  - Clark, Alan
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1997-04-01 12:04:00
LA  - en
M1  - 46
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1997
TI  - Recent Results and Future Challenges for the NIST Charged-Capacitor Experiment
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5469
ER  -