TY  - CONF
AU  - Ono, Ronald
AU  - Beall, James
AU  - Ekin, John
AU  - Nelson, A.
AU  - Kazmerski, L.
AU  - Mason, A.
AU  - Swartzlander, A.
AU  - McConnell, R.
C2  - Proc., Second Conf. on Superconductivity and Applications, Buffalo, NY, USA
DA  - 1988-12-31 00:12:00
LA  - en
PB  - Proc., Second Conf. on Superconductivity and Applications, Buffalo, NY, USA
PY  - 1988
TI  - Surface Analysis of Interfacial Properties for Thin Film and Bulk YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub>
ER  -