TY  - CONF
AU  - Roitman, Peter
AU  - Edelstein, Monica
AU  - Krause, S.
C2  - IEEE International SOI Conference, Stuart, FL, USA
DA  - 1998-10-05 00:10:00
LA  - en
PB  - IEEE International SOI Conference, Stuart, FL, USA
PY  - 1998
TI  - Electrical Detection of Defects in SIMOX Buried Oxides: Pipes and Precipitates
ER  -