TY  - CONF
AU  - Moreland, John
AU  - Kabos, Pavel
AU  - Jander, Albrecht
AU  - Loehndorf, M.
AU  - McMichael, Robert
AU  - Lee, C
C2  - Proc., SPIE, Micromachined Devices and Components IV, vol. 4176, Santa Clara, CA, USA
DA  - 2000-09-01 00:09:00
LA  - en
PB  - Proc., SPIE, Micromachined Devices and Components IV, vol. 4176, Santa Clara, CA, USA
PY  - 2000
TI  - Micromechanical Detectors for Ferromagnetic Resonance Spectroscopy
ER  -