TY  - GEN
AU  - Seiler, David
AU  - Lowney, J
AU  - Thurber, W.
AU  - Kopanski, Joseph
AU  - Harman, George
C2  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1994-04-01 00:04:00
LA  - en
PB  - Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1994
TI  - Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13439
ER  -