TY  - JOUR
AU  - Aized, D
AU  - Haddad, J
AU  - Joshi, C
AU  - Goodrich, Loren
AU  - Srivastava, A
C2  - IEEE Transactions on Magnetics
DA  - 1994-07-01 00:07:00
LA  - en
M1  - 30(4)
PB  - IEEE Transactions on Magnetics
PY  - 1994
TI  - Comparing the Accuracy of Critical-Current Measurements Using the Voltage-Current Simulator
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30412
ER  -