TY  - JOUR
AU  - Kolodzey, J
AU  - Chowdhury, E
AU  - Adam, T
AU  - Qui, G
AU  - Rau, I
AU  - Olowolafe, J
AU  - Suehle, John
AU  - Chen, Y
C2  - IEEE Transactions on Electron Devices
DA  - 2000-03-23 00:03:00
LA  - en
M1  - 47
PB  - IEEE Transactions on Electron Devices
PY  - 2000
TI  - Electrical Conduction and Dielectric Breakdown in Aluminum Oxide Insulators on Silicon
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30168
ER  -