TY  - JOUR
AU  - Fujii, K
AU  - Williams, Edwin
AU  - Steiner, Richard
AU  - Newell, David
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1997-04-01 12:04:00
LA  - en
M1  - 46
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1997
TI  - A New Refractometer by Combining a Variable Length Vacuum Cell and a Double-Pass Michelson Interferometer
ER  -