TY  - JOUR
AU  - Avramov, S.
AU  - Koffman, Andrew
AU  - Oldham, Nile
AU  - Waltrip, Bryan
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2000-04-01 00:04:00
LA  - en
M1  - 49
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2000
TI  - The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=16695
ER  -