TY  - CONF
AU  - Bennett, Herbert
AU  - Lowney, J
AU  - Tomizawa, M.
AU  - Ishibashi, T.
C2  - Proc.,  1991 International Workshop on VLSI Process and Device Modeling (1991 VPAD), Oiso, 1, JA
DA  - 1991-12-31 00:12:00
LA  - en
PB  - Proc.,  1991 International Workshop on VLSI Process and Device Modeling (1991 VPAD), Oiso, 1, JA
PY  - 1991
TI  - Experimentally Verified Majority and Minority Mobilities in Heavily Doped GaAs for Device Simulations, Extended Abstract
ER  -