TY  - JOUR
AU  - Gajewski, Donald
AU  - Guyer, Jonathan
C2  - Applied Physics Letters
DA  - 2000-07-24 00:07:00
LA  - en
PB  - Applied Physics Letters
PY  - 2000
TI  - In Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs
ER  -