TY  - JOUR
AU  - Suehle, John
AU  - Gallo, Kathleen
C2  - Microelectronics Journal
DA  - 1990-06-01 00:06:00
LA  - en
M1  - 21
PB  - Microelectronics Journal
PY  - 1990
TI  - The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits
ER  -