TY  - GEN
AU  - Seiler, David
AU  - Littler, Chris
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-08-01 00:08:00
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - International Conference on Narrow-Gap Semiconductors and Related Materials
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=5694
ER  -