TY  - CONF
AU  - Khera, D.
AU  - Linholm, Loren
AU  - Allen, Richard
AU  - Cresswell, Michael
AU  - Tyree, V.
AU  - Hansford, W.
AU  - Pina, C.
C2  - Proc., IEEE International Conference on Microelectronic Test Structures, Kyoto, 1, JA
DA  - 1991-12-31 00:12:00
LA  - en
PB  - Proc., IEEE International Conference on Microelectronic Test Structures, Kyoto, 1, JA
PY  - 1991
TI  - Knowledge Verification of Machine-Learning Procedures Based on Test Structure Measurements
ER  -