TY  - CONF
AU  - Roitman, Peter
AU  - Edelstein, Monica
AU  - Krause, S.
AU  - Visitserngtrakul, S.
C2  - 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA
DA  - 1990-12-31 00:12:00
LA  - en
PB  - 1990 IEEE SOS/SOI Technology Conference, Key West, FL, USA
PY  - 1990
TI  - Residual Defects in SIMOX: Threading Dislocations and Pipes, Technical Abstracts
ER  -