TY  - CONF
AU  - Schafft, Harry
AU  - Lechner, J.
AU  - Sabi, B.
AU  - Smith, R
C2  - Proc., 1987 Wafer Reliability Workshop, Lake Tahoe, CA, USA
DA  - 1988-12-31 00:12:00
LA  - en
PB  - Proc., 1987 Wafer Reliability Workshop, Lake Tahoe, CA, USA
PY  - 1988
TI  - How Good Are Your Estimates of t<sub>50</sub> and &#916;
ER  -