TY  - CONF
AU  - Roggen, A. van
AU  - Yuwono, L.
AU  - Zhou, Hui
AU  - Meijer, Paul
AU  - Kopanski, Joseph
C2  - Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Pocono Manor, PA, USA
DA  - 1990-12-01 00:12:00
LA  - en
PB  - Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Pocono Manor, PA, USA
PY  - 1990
TI  - Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
ER  -