TY  - GEN
AU  - Geist, Jon
AU  - Kohler, Tina
AU  - Goebel, R.
AU  - Robinson, A.
AU  - James, C.
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1991-08-30 00:08:00
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1991
TI  - Numerical Modeling of Silicon Photodiodes for High-Accuracy Applications. Part II: Interpreting Oxide-Bias Experiments
ER  -