TY  - GEN
AU  - Geist, Jon
AU  - Schaefer, A.
AU  - Song, J-F.
AU  - Wang, Y.
AU  - Zalewski, E.
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1990-10-30 00:10:00
LA  - en
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1990
TI  - An Accurate Value for the Absorption Coefficient of Silicon at 633 nm
ER  -