TY  - CONF
AU  - Linholm, Loren
AU  - Khera, D.
AU  - Reeve, C.
AU  - Cresswell, Michael
C2  - Proc., IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA
DA  - 1988-12-31 00:12:00
LA  - en
PB  - Proc., IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA
PY  - 1988
TI  - A Developmental Expert System for Test Structure Data Evaluation
ER  -