TY  - CONF
AU  - Evans, C
AU  - Polvani, R.
AU  - Postek, Michael
AU  - Rohrer, R.
C2  - Proc. Intl. Soc. for Optical Engineering (SPIE), In-Process Optical Metrology for Precision Machining, The Hague, 1, NL
DA  - 1987-12-31 00:12:00
LA  - en
M1  - 802
PB  - Proc. Intl. Soc. for Optical Engineering (SPIE), In-Process Optical Metrology for Precision Machining, The Hague, 1, NL
PY  - 1987
TI  - Some Observations on Tool Sharpness and Sub-Surface Damage in Single Point Diamond Turning
ER  -