TY  - JOUR
AU  - Schlager, John
AU  - Jinno, M.
AU  - Franzen, Douglas
C2  - IEEE Photonics Technology Letters
DA  - 1995-02-01 00:02:00
LA  - en
M1  - 7
PB  - IEEE Photonics Technology Letters
PY  - 1995
TI  - Millimeter-Resolution Optical Time-Domain Reflectometry Using a Four Wave Mixing Sampling Gate
ER  -