TY  - JOUR
AU  - Jr., Joseph Kinard
AU  - Huang, D.
AU  - Novotny, Donald
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1995-07-01 00:07:00
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1995
TI  - Integrated Thin-Film Micropotentiometers
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=16105
ER  -