TY  - JOUR
AU  - Schafft, Harry
AU  - Suehle, John
C2  - Solid-State Electronics
DA  - 1992-12-31 00:12:00
LA  - en
M1  - 35
PB  - Solid-State Electronics
PY  - 1992
TI  - The Measurement, Use, and Interpretation of the Temperature Coefficient of Resistance of Metallizations
ER  -