TY  - JOUR
AU  - Gaitan, Michael
AU  - Mayergoyz, I.
AU  - Korman, C.
C2  - IEEE Transactions on Electron Devices
DA  - 1990-04-30 00:04:00
LA  - en
PB  - IEEE Transactions on Electron Devices
PY  - 1990
TI  - Investigation of the Threshold Voltage of MOSFETs with Position- and Potential- Dependent Interface Trap Distributions Using a Fixed-Point Iteration Method
ER  -