TY  - CONF
AU  - Khera, D.
AU  - Zaghloul, Mona
AU  - Linholm, Loren
AU  - Wilson, Charles
C2  - Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures, Edinburgh, 1, UK
DA  - 1989-12-31 00:12:00
LA  - en
PB  - Proc. ICMTS 1989, Intl. Conf. on Microelectronic Test Structures, Edinburgh, 1, UK
PY  - 1989
TI  - A Neural Network Approach for Classifying Test Structure Results
ER  -