TY  - CONF
AU  - Elmquist, Randolph
AU  - Zimmerman, Neil
AU  - Huber, William
C2  - Conference Digest, Ottawa, 1, CA
DA  - 2002-06-01 00:06:00
LA  - en
PB  - Conference Digest, Ottawa, 1, CA
PY  - 2002
TI  - Using a High-Value Resistor in Single-Electron Counting Measurements
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=21883
ER  -