TY  - JOUR
AU  - Vogel, Eric
AU  - Henson, W.
AU  - Richter, Curt
AU  - Suehle, John
C2  - IEEE Transactions on Electron Devices
DA  - 2000-03-01 00:03:00
LA  - en
M1  - 47
PB  - IEEE Transactions on Electron Devices
PY  - 2000
TI  - Limitations of Conductance to the Measurement of the Interface State Density of MOS Capacitors with Tunneling Gate Dielectrics
ER  -