TY  - JOUR
AU  - McKnight, R.
AU  - Lagnese, J.
AU  - Zhang, Y.
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1990-04-01 00:04:00
LA  - en
M1  - 39
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1990
TI  - Characterizing Transient Measurements by Use of the Step Response and the Convolution Integral
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=27889
ER  -