TY  - JOUR
AU  - Schafft, Harry
AU  - Head, Linda
AU  - Gill, Jason
AU  - Sullivan, Timothy
C2  - Microelectronics Reliability
DA  - 2003-01-01 00:01:00
LA  - en
M1  - 2003
PB  - Microelectronics Reliability
PY  - 2003
TI  - Early Reliability Assessment Using Deep Censoring
ER  -