TY  - CONF
AU  - Pratt, Jon
AU  - Newell, David
AU  - Williams, Edwin
AU  - Smith, Douglas
AU  - Kramar, John
C2  - Proc. 2nd Intl. Conf. European Soc. for Precision Engineering and Nanotechnology (EUSPEN), Undefined
DA  - 2001-05-01 00:05:00
LA  - en
PB  - Proc. 2nd Intl. Conf. European Soc. for Precision Engineering and Nanotechnology (EUSPEN), Undefined
PY  - 2001
TI  - Towards a Traceable Nanoscale Force Standard
ER  -