TY  - CONF
AU  - Richter, Curt
AU  - Stewart, D
C2  - GOMAC Digest of Technical Papers, Tampa, FL, USA
DA  - 2003-03-31 00:03:00
LA  - en
M1  - 28
PB  - GOMAC Digest of Technical Papers, Tampa, FL, USA
PY  - 2003
TI  - Metrology for Molecular Electronics
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30926
ER  -