TY  - GEN
AU  - Williams, Edwin
AU  - Ghosh, R.
AU  - Martinis, John
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1992-03-01 00:03:00
LA  - en
M1  - 92
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1992
TI  - Measuring the Electron's Charge and the Fine-Structure Constant by Counting Electrons on a Capacitor
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=24186
ER  -