TY  - CONF
AU  - Weil, Claude
AU  - Janezic, Michael
AU  - Jones, Chriss
AU  - Vanzura, E.
C2  - Proc., Conf. Prec. Electromagn. Meas., Washington, DC
DA  - 1998-07-01 00:07:00
LA  - en
PB  - Proc., Conf. Prec. Electromagn. Meas., Washington, DC
PY  - 1998
TI  - Measurement Intercomparisons of Dielectric and Magnetic Material Characterization
ER  -