TY  - JOUR
AU  - Souders, T.
AU  - Flach, D.
AU  - Hagwood, C
AU  - Yang, G.
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1990-02-01 00:02:00
LA  - en
M1  - 39
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1990
TI  - The Effects of Timing Jitter in Sampling Systems
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=27591
ER  -