TY  - CONF
AU  - Menon, S.
AU  - Fazekas, J.
AU  - Hagen, Jochen von
AU  - Head, Linda
AU  - Hood, Colleen
AU  - Schafft, Harry
C2  - 1999 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
DA  - 2000-03-01 00:03:00
LA  - en
PB  - 1999 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
PY  - 2000
TI  - Impact of Test-Structure Design and Test Methods for Electromigration Testing
ER  -