TY  - JOUR
AU  - Wang, Yun
AU  - Cheung, Kin
AU  - Choi, Y.J.
AU  - Lee, Byoung
C2  - IEEE Transactions on Electron Devices
DA  - 2008-09-01 00:09:00
LA  - en
M1  - 55
PB  - IEEE Transactions on Electron Devices
PY  - 2008
TI  - An Accurate Capacitance-Voltage Measurement Method for Highly Leaky Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32746
ER  -