TY  - JOUR
AU  - Fujii, G
AU  - Ekin, John
AU  - Radebaugh, Ray
AU  - Clark, Alan
C2  - Advances in Cryogenic Engineering
DA  - 1980-08-01 00:08:00
LA  - en
PB  - Advances in Cryogenic Engineering
PY  - 1980
TI  - Effect of Thermal Contraction of Sample Holder Material on Critical Current Measurement
ER  -