TY - JOUR AU - Lang, Kristine AU - Hite, Dustin AU - Simmonds, Raymond AU - Mcdermott, Robert AU - Pappas, David AU - Martinis, John C2 - Review of Scientific Instruments DA - 2004-08-13 00:08:00 LA - en M1 - 75 PB - Review of Scientific Instruments PY - 2004 TI - Conducting atomic force microscopy for Nanoscale tunnel barrier characterization UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31457 ER -