TY  - JOUR
AU  - Vogel, Eric
AU  - Heh, Da-Wei
AU  - Bernstein, J
C2  - IEEE Electron Device Letters
DA  - 2002-11-01 00:11:00
LA  - en
M1  - 23
PB  - IEEE Electron Device Letters
PY  - 2002
TI  - Impact of the Trapping of Anode Hot Holes on Silicon Dioxide Breakdown
ER  -