TY  - CONF
AU  - Kalappa, Naveen
AU  - Moyne, James
AU  - Parrott, Jonathan
AU  - Li-Baboud, Ya-Shian
C2  - Proceedings of the 2006 IEEE-1588 Conference, Gaithersburg, MD, USA
DA  - 2006-11-30 00:11:00
LA  - en
PB  - Proceedings of the 2006 IEEE-1588 Conference, Gaithersburg, MD, USA
PY  - 2006
TI  - Practical Aspects Impacting Time Synchronization Data Quality in Semiconductor Manufacturing
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32530
ER  -