TY  - JOUR
AU  - Edwards, H
AU  - Jorgensen, J
AU  - Dagata, John
AU  - Strausser, Y
AU  - Schneir, J
C2  - Journal of Vacuum Science and Technology B
DA  - 1998-03-01 00:03:00
LA  - en
M1  - 16(2)
PB  - Journal of Vacuum Science and Technology B
PY  - 1998
TI  - Influence of Data Analysis and Other Factors on the Short-term Stability of Vertical Scanning-Probe Microscope Calibration Measurements
ER  -