TY  - CONF
AU  - Keller, Robert
AU  - Geiss, Roy
AU  - Cheng, Yi-Wen
AU  - Read, David
C2  - Proc. Intl. Conf. on Characterization and Metrology for ULSI Technology, Austin, TX, USA
DA  - 2005-03-01 00:03:00
LA  - en
M1  - 788
PB  - Proc. Intl. Conf. on Characterization and Metrology for ULSI Technology, Austin, TX, USA
PY  - 2005
TI  - Electric Current Induced Thermomechanical Fatigue Testing of Interconnects
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50110
ER  -