TY  - CONF
AU  - Mueller, Jens
AU  - Balzar, Davor
AU  - Geiss, Roy
AU  - Read, David
AU  - Keller, Robert
C2  - Advances in X-Ray Analysis, Colorado Springs, CO, USA
DA  - 2006-10-02 00:10:00
LA  - en
PB  - Advances in X-Ray Analysis, Colorado Springs, CO, USA
PY  - 2006
TI  - COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50205
ER  -