TY  - SER
AU  - Keller, Robert
AU  - Hurley, Donna
AU  - Read, David
AU  - Rice, Paul
C2  - Springer Publishing Company, New York, NY
DA  - 2008-01-01 00:01:00
LA  - en
PB  - Springer Publishing Company, New York, NY
PY  - 2008
TI  - Metrologies for Mechanical Response of Micro- and Nanoscale Systems
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50654
ER  -