TY  - JOUR
AU  - Bergman, David
AU  - Waltrip, Bryan
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2002-05-01 00:05:00
LA  - en
M1  - 52
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2002
TI  - A Low Noise Latching Comparator Probe for Waverform Sampling Applications
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33117
ER  -