TY  - JOUR
AU  - Richter, Curt
AU  - Stewart, D
AU  - Ohlberg, D
AU  - Williams, R.
C2  - Applied Physics A-Materials Science & Processing
DA  - 2005-03-11 00:03:00
LA  - en
M1  - 80
PB  - Applied Physics A-Materials Science & Processing
PY  - 2005
TI  - Electrical Characterization of Al/AlOx/Molecule/Ti/Al Devices?
ER  -