TY  - JOUR
AU  - Laug, Owen
AU  - Souders, T.
AU  - Flach, D.
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 1992-12-01 00:12:00
LA  - en
M1  - 41
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 1992
TI  - A Custom Integrated Circuit Comparator for High Performance Sampling Applications
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=19462
ER  -