TY  - JOUR
AU  - Singh, Ranbir
AU  - Jr., Allen Hefner
C2  - Microelectronics Reliability
DA  - 2005-12-27 00:12:00
LA  - en
M1  - 46
PB  - Microelectronics Reliability
PY  - 2005
TI  - Reliability and Performance Limitations in SiC Power Devices
ER  -