TY  - CONF
AU  - Heh, Da-Wei
AU  - Vogel, Eric
AU  - Bernstein, J
C2  - IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf, CA, USA
DA  - 2004-10-15 00:10:00
LA  - en
PB  - IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf, CA, USA
PY  - 2004
TI  - New Insights into Threshold Voltage Shifts for Ultrathin Gate Oxides
ER  -